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SIFT: David Lowe, UBC
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SIFT - Key Point Extraction
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Advantages
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Invariant Local Features
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Steps for Extracting Key Points
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Scale Space (Witkin, IJCAI 1983) • Apply whole spectrum of scales
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Approximation of LOG by Difference of Gaussians
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Building a Scale Space
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How many scales per octave?
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Initial value of sigma
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Scale Space Peak Detection
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Key Point Localization
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Initial Outlier Rejection
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Further Outlier Rejection
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Orientation Assignment
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Similarity to IT cortex
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Extraction of Local Image Descriptors at Key Points
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Descriptor Regions (n by n)
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Key point matching
Description:
Explore the Scale-invariant Feature Transform (SIFT) in this comprehensive lecture from the UCF Computer Vision Video Lectures 2012 series. Delve into the intricacies of SIFT, developed by David Lowe at UBC, as Dr. Mubarak Shah guides you through key point extraction, advantages, and invariant local features. Learn the steps for extracting key points, including scale space concepts, approximation of LOG by Difference of Gaussians, and building a scale space. Discover techniques for scale space peak detection, key point localization, and outlier rejection. Examine orientation assignment and its similarity to the IT cortex. Master the extraction of local image descriptors at key points, understanding descriptor regions and key point matching. Gain valuable insights into this powerful computer vision technique through detailed explanations and visual aids.

Scale-invariant Feature Transform (SIFT) - Lecture 5

University of Central Florida
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