Charged-Particle Interaction Analysis - From Optical Microscopy Limits to Advanced Electron Microscopy Techniques

Charged-Particle Interaction Analysis - From Optical Microscopy Limits to Advanced Electron Microscopy Techniques

Explore the fundamentals of Scanning Electron Microscopy (SEM) and related charged-particle interaction analysis techniques in this comprehensive 1 hour 48 minute seminar. Begin with an overview of optical microscopy limitations before delving into SEM components, including electron emission, electromagnetic lenses, and beam-sample interactions. Learn about various detection methods, image enhancement techniques, and advanced characterization tools like Energy Dispersive X-Ray Spectroscopy (EDS/EDX), Electron Probe Microanalysis (EPMA), and Electron Backscatter Diffraction (EBSD). Gain practical insights through interactive simulations, online tools, and a live demonstration of a Field Emission SEM. Suitable for beginners, this talk provides a solid foundation in micro/nano-characterization techniques and guides participants towards deeper understanding with supplementary materials.