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Charged-Particle Interaction Analysis
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Outline
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Limits of Optical Microscopy
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Limits of Optical Microscopy
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Limits of Optical Microscopy
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Limits of Optical Microscopy
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Limits of Optical Microscopy
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SEM: The Big Picture
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SEM: The Big Picture
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Electron Emission
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Electron Emission
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Electron Emission
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Electron Emission
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Electron Emission
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Electron Emission
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Electron Emission
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Electron Emission
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Electron Emission
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Electromagnetic Lens
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Electromagnetic Lens
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Electromagnetic Lens
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Electromagnetic Lens
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Electromagnetic Lens
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Electromagnetic Lens
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Electromagnetic Lens
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Electromagnetic Lens
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Electromagnetic Lens
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Electromagnetic Lens
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Apertures
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Apertures
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Raster Coils
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Raster Coils
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Raster Coils
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Raster Coils
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Raster Coils
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Noise Reduction
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Stage
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Beam Sample Interaction
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Beam Sample Interaction
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Beam Sample Interaction
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Beam Sample Interaction
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Beam Sample Interaction
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Beam Sample Interaction
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Beam Sample Interaction
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Beam Sample Interaction
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Beam Sample Interaction
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Beam Detection
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Beam Detection
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Beam Detection
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Beam Detection
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Beam Detection
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Beam Detection
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Charging
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Charging
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Image Enhancement
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Image Enhancement
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Image Enhancement
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Image Enhancement
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Image Enhancement
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Image Enhancement
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Image Enhancement
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Image Enhancement
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Image Enhancement
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Image Enhancement
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Energy Dispersive X-Ray Spectroscopy EDS/EDX
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Energy Dispersive X-Ray Spectroscopy EDS/EDX
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Energy Dispersive X-Ray Spectroscopy EDS/EDX
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Energy Dispersive X-Ray Spectroscopy EDS/EDX
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Energy Dispersive X-Ray Spectroscopy EDS/EDX
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Energy Dispersive X-Ray Spectroscopy EDS/EDX
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Energy Dispersive X-Ray Spectroscopy EDS/EDX
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Energy Dispersive X-Ray Spectroscopy EDS/EDX
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Energy Dispersive X-Ray Spectroscopy EDS/EDX
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Energy Dispersive X-Ray Spectroscopy EDS/EDX
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Energy Dispersive X-Ray Spectroscopy EDS/EDX
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Electron Probe Microanalysis EPMA
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Electron Probe Microanalysis EPMA
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Electron Probe Microanalysis EPMA
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Electron Probe Microanalysis EPMA
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Electron Probe Microanalysis EPMA
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Electron Probe Microanalysis EPMA
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Electron Probe Microanalysis EPMA
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Electron Probe Microanalysis EPMA
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Electron Probe Microanalysis EPMA
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Electron Probe Microanalysis EPMA
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Electron Probe Microanalysis EPMA
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Electron Backscatter Diffraction
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Electron Backscatter Diffraction
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Electron Backscatter Diffraction
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Electron Backscatter Diffraction
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Electron Backscatter Diffraction
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Electron Backscatter Diffraction
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Electron Backscatter Diffraction
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Electron Backscatter Diffraction
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Electron Backscatter Diffraction
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Electron Backscatter Diffraction
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Electron Backscatter Diffraction
Description:
Explore the fundamentals of Scanning Electron Microscopy (SEM) and related charged-particle interaction analysis techniques in this comprehensive 1 hour 48 minute seminar. Begin with an overview of optical microscopy limitations before delving into SEM components, including electron emission, electromagnetic lenses, and beam-sample interactions. Learn about various detection methods, image enhancement techniques, and advanced characterization tools like Energy Dispersive X-Ray Spectroscopy (EDS/EDX), Electron Probe Microanalysis (EPMA), and Electron Backscatter Diffraction (EBSD). Gain practical insights through interactive simulations, online tools, and a live demonstration of a Field Emission SEM. Suitable for beginners, this talk provides a solid foundation in micro/nano-characterization techniques and guides participants towards deeper understanding with supplementary materials.

Charged-Particle Interaction Analysis - From Optical Microscopy Limits to Advanced Electron Microscopy Techniques

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Charged-Particle Interaction Analysis