Explore the fundamentals and advanced applications of Transmission Electron Microscopy (TEM) in this comprehensive 46-minute lecture by Nan Yao from Princeton University. Delve into the physics behind TEM, compare it with optical microscopes, and understand key components like electron guns, lenses, and sample holders. Discover how TEM enables visualization of structures from angstroms to microns, crucial for nanotechnology, nanobiotechnology, and nanomaterials characterization. Learn about recent advancements including aberration correction techniques, high-resolution imaging, and in-situ observations of atomic-scale phenomena. Witness practical demonstrations of TEM characterization of nanomaterials and gain insights into its relevance for undergraduate technical education in this NACK - Nano-Educators Topical Seminar Series presentation.