Explore the fascinating world of Atomic Force Microscopy (AFM) in this 23-minute video. Learn about the principles behind AFM through a DIY "macro-AFM" demonstration, then witness a real AFM (nGauge AFM from ICSPI) in action with various scans. Discover how AFM complements Scanning Electron Microscopy (SEM) and excels in precise heightmaps, easy scanning, and diverse related techniques. Follow along as the video covers topics such as cantilever displacement sensing, tricky aspects of scanning probe microscopy, and MEMs scanners. Observe practical applications through scans of tungsten carbide inserts, ablated aluminum, and gage blocks, gaining insights into this powerful imaging technique used in scientific research and material analysis.