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1
Properties of light, Image formation
2
Magnification and resolution
3
Depth of field,focus and field of view
4
Lens defects,filters and light microscopy introduction
5
Optical microscope demo., Bright field imaging, opaque specimen illumination
6
Opaque stop microscopy, Phase contrast microscopy
7
Dark field microscopy, Polarization microscopy
8
Differential interference contrast and fluorescence microscopy
9
Sample preparation techniques for optical microscopy
10
Tutorial problems
11
continuation-Tutorial problems
12
Introduction to scanning electron Microscopy
13
Lens aberrations, Object resolution, Image quality
14
Interaction between electrons and sample, Imaging capabilities
15
SEM and its mode of operation, Effect of aperture size,Working distance,condenser lens strength
16
SEM and its mode of operation- continuation
17
Factors affecting Interaction volume, Demonstration of SEM
18
Image formation and interpretation
19
Image formation and interpretation continued, EDS, WDS
20
Special contrast mechanisms, Monte Carlo simulations of Interaction volume
21
Electron channeling contrast imaging (ECCI), (EBSD)-Theory & instrument demonstration
22
Tutorial Problems on SEM
23
Basics of X-ray emission from source, electron excitation and X-ray interaction
24
Properties of X-rays
25
Bragg's Law Derivation
26
Diffraction relationship with reciprocal space
27
X-ray scattering
28
Factors affecting intensities of X-ray peaks
29
Factors affecting intensities of X-ray peaks- continuation
30
Effect of crystallite size and strain on intensity of X-rays
31
Profile fit, Factors affecting peak brodening
32
Indexing of diffraction pattern, Quantitative analysis
33
Indexing, Quantitative analysis-continuation, Residual stress measurements
34
XRD and Residual stress measurement- lab demonstration
35
Introduction to Transmission Electron Microscopy (TEM)
36
Fundementals of Transmission Electron Microscopy (TEM)
37
Basics of Diffraction-1
38
Basics of Diffraction-2
39
TEM imaging-1
40
TEM imaging-2
41
TEM instrument demonstration
42
TEM sample preparation-1-
43
TEM sample preparation-2
Description:
PRE-REQUISITES : Nil INTENDED AUDIENCE : Undergraduate students of Metallurgical and Materials, Physics, Chemistry and biological sciences INDUSTRIES APPLICABLE TO : All the Metallurgical and automotive industries will be interested in this course COURSE OUTLINE : It is the first course at the undergraduate level on microstructural characterization of materials. This course will cover the basic principles and techniques of X-ray diffraction, optical, scanning electron and transmission electron microscopy along with demonstrations of the instrument details and imaging experiments through videos. This course also deals with the sample preparation techniques for the microstructural analysis with practical examples through videos. ABOUT INSTRUCTOR :Prof. S.Sankaran is presently Associate Professor in the Department of Metallurgical and Materials Engineering, IIT Madras. His research interests are deformation processing of materials, mechanical behavior of materials and electron microscopy. He is also presently the faculty incharge of central electron microscopy of IIT Madras. Read more

Materials Characterization

Indian Institute of Technology Madras
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#Social Sciences #Economics #Macroeconomics #Science #Physics #Optics #Diffraction #Biology #Microscopy #Electron Microscopy #Transmission Electron Microscopy #Optical Microscopy #Scanning Electron Microscopy
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Properties of light, Image formation