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Learn about the significant advancements in electronics testing and production through a 30-minute MEPTEC conference talk exploring the evolution from algorithmic approaches to unsupervised machine learning techniques in semiconductor manufacturing and quality control.
Big Strides in Electronics Test and Production - From Algorithmic Methods to Unsupervised Machine Learning
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#Computer Science
#Machine Learning
#Unsupervised Learning
#Algorithms
#Engineering
#Manufacturing
#Quality Control
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