Главная
Study mode:
on
1
Intro
2
The Good & The Bad
3
Challenges: Binary Analysis
4
Challenges: Fuzzing Challenge
5
IRQ Fuzzing
6
Workflow
7
Implementation Details
8
Evaluation
9
Trace Analysis Correctness
10
Fuzzing Coverage
11
Attack Surface Reduction
12
Conclusions
Description:
Explore techniques for reducing driver attack surfaces in embedded devices through IRQDebloat. Delve into the challenges of binary analysis and fuzzing in this IEEE conference talk. Learn about the innovative IRQ fuzzing approach, its workflow, and implementation details. Examine the evaluation process, including trace analysis correctness, fuzzing coverage, and attack surface reduction. Gain insights into improving embedded device security and mitigating potential vulnerabilities in driver code.

IRQDebloat - Reducing Driver Attack Surface in Embedded Devices

IEEE
Add to list
0:00 / 0:00