Explore automotive security vulnerabilities and hacking techniques in this Black Hat conference talk. Delve into the world of extracting and analyzing automotive firmware efficiently, focusing on an Instrument Cluster as the target. Learn about fault injection techniques, including tooling and glitching methods to bypass security checks and access memory. Discover the process of finding optimal parameters through randomization and understand the challenges of achieving a 100% success rate. Examine static analysis approaches, emulation of CPU architecture, and implementation of peripherals. Gain insights into execution tracing, taint tracking, and the importance of debug interfaces. Discuss electromagnetic fault injection, universal applicability of fault injection techniques, and strategies for hardening ECU hardware, software, and design. Acquire key takeaways on automotive security and the prevalence of glitches in embedded systems.
There Will Be Glitches - Extracting and Analyzing Automotive Firmware Efficiently