Главная
Study mode:
on
1
Intro
2
Takeaways
3
Why is this getting important?
4
Voltage glitching: Flash reads
5
Voltage glitching: RAM reads
6
Three steps to success
7
Power domains
8
Removing capacitors: Problem...
9
The chip.fail glitcher
10
Digilent Cmod A7
11
MAX PMOD
12
Hooking it up
13
The glitcher
14
FPGA Bitstream
15
Host control: Jupyter Notebook
16
Host control: Example glitcher
17
nRF52840: Test firmware
18
Glitching results
19
ESP32: Glitching
20
The 5$ Glitcher...
21
Previous work
22
STM32 Read-out Protection (RDP)
23
Dumping the bootrom
24
Let's apply our methodology
25
Bootrom Glitching
26
STM32F2 Boot process (1.4ms)
27
Power consumption after reset (200)
28
Parameters
29
Dumping the money!
30
The STM32F2 Glitcher
31
Options for defense
32
Conclusion
Description:
Explore fault injection attacks on popular IoT processors using affordable equipment in this Black Hat conference talk. Delve into voltage glitching techniques for flash and RAM reads, learn the three steps to successful attacks, and understand power domains and capacitor removal challenges. Discover the chip.fail glitcher, including its FPGA bitstream and host control via Jupyter Notebook. Examine glitching results on nRF52840 and ESP32 processors, and investigate the $5 glitcher option. Analyze STM32 Read-out Protection (RDP) and bootrom dumping techniques, focusing on the STM32F2 boot process and power consumption. Learn about parameter adjustments, successful data extraction, and explore defense options against these attacks. Gain insights into the silicon vulnerabilities of the connected world and acquire knowledge of software and hardware tools for conducting fault injection attacks.

Chip.Fail - Glitching the Silicon of the Connected World

Black Hat
Add to list
0:00 / 0:00