Explore a conference talk from CCS 2016 that presents a scalable graph-based approach for bug searching in firmware images. Learn about the challenges of finding vulnerabilities in IoT devices and the innovative solution proposed by researchers from Syracuse University. Discover how raw feature extraction, feature learning, and high-level feature encoding contribute to efficient bug detection. Examine the evaluation process, including datasets, baseline comparisons, true positive rates, ROC curves, search efficiency, and scalability. Gain insights into the preparation time and comparative analysis with other methods. Conclude with a case study that demonstrates the practical application of this cutting-edge technique in enhancing IoT device security.